Topological materials attract great interest and may provide the basis for a new era in materials development. In Science Advances, physicists around Andreas Elben, Jinlong Yu, Peter Zoller and Benoit Vermersch now present a new measuring method to identify and characterize so-called topological invariants on various experimental platforms.
Topological materials attract great interest and may provide the basis for a new era in materials development. In Science Advances, physicists around Andreas Elben, Jinlong Yu, Peter Zoller and Benoit Vermersch now present a new measuring method to identify and characterize so-called topological invariants on various experimental platforms.
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